Events and Seminars

DEKRA iST was invited to attend the seminar "Digital Power Driven Biaxial Transformation: A Green Revolution in Electronic System Development" on 10th September hosted by CTIMES. Technical Manager Bobby Hsieh brought the latest insights into the development of WBG semiconductor technology, "Discussion on Reliability Testing & Measurement Techniques for Wide Band gap Power Device." He delved into emerging WBG semiconductor standards, and what's more, highlighted the importance of selecting the right reliability validation approach for high-performance power systems. His focus underscores how these methods are crucial to enhance system reliability and ensure stable, persistent operation.

DEKRA iST was invited to attend the "Power Technology Forum - High Performance Power Conversion Design" hosted by DIGITIMES. Senior Manager Max Chen shared with the audience "Operating Reliability Validation and Dynamic Measurement Methodology of Wide Band Gap Power Devices."

On May 30th, DEKRA iST was invited to attend 2024 Future Car Technology Forum held by EETimes at the HNBK International Convention Center. Wangchu Chen, Director of the High-Power Engineering Department of DEKRA iST, delivered a speech on "Exploring the New Trend and Challenge of EV Powertrain and Self-driving Vehicle on Reliability Validation by International Standards." In addition to the technology development in the automotive industry and the differences in the new edition of the commonly used international standard ISO 16750 for road vehicles, he also pointed out the issues usually faced by customers, as well as the potent solutions that DEKRA iST proposes to all kinds of bottlenecks when undergoing testing for automotive components.

On March 21st, the "International Industry Forum on Technologies and Future Applications Trend of Wide Bandgap Components," was jointly organized by the Industrial Bureau of the Ministry of Economic Affairs and EETimes at the HNBK International Convention Center. DEKRA iST was invited to share Operating Reliability Validation and Dynamic Measurement Methodology of Wide Bandgap Power Devices. The venue was filled to capacity, with a captivated audience attentively listening to discussions about the validation technology trends of wide bandgap power devices.